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RE: next step




>As a general rule, there is hesistancy with regards to the offset/length/mask method of specifying classification rules for >sampling since it is very hard to verify that no value a customer can input will keep from causing problems in
>some dimension.  And the vendor always seems to get blamed in such cases :)   There is certainly discussion about it, but    >quite a bit of hesitancy.
>
>It is generally preferred to have a list of interesting fields for classification (as is being defined in some versions of 
>the proposed IPFIX data model) and let the fields be specified for classification.

I used offset/length/mask as an example.With the advent of 
many technologies like VPN,MPLS and diffserv etc,having a list
of interesting fields for classification is the present day
practice.

-Senthil

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